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dc.contributor.authorJove, Esteban
dc.contributor.authorAveleira Mata, Jose Antonio
dc.contributor.authorAlaiz Moretón, Héctor
dc.contributor.authorCasteleiro-Roca, José-Luis
dc.contributor.authorMarcos del Blanco, David Yeregui
dc.contributor.authorZayas-Gato, Francisco
dc.contributor.authorQuintián, Héctor
dc.contributor.authorCalvo-Rolle, José Luis
dc.date.accessioned2022-05-12T16:09:40Z
dc.date.available2022-05-12T16:09:40Z
dc.date.issued2022-01-30
dc.identifier.citationJove, E.; Aveleira-Mata, J.; Alaiz-Moretón, H.; Casteleiro-Roca, J.-L.; Marcos del Blanco, D.Y.; Zayas-Gato, F.; Quintián, H.; Calvo-Rolle, J.L. Intelligent One-Class Classifiers for the Development of an Intrusion Detection System: The MQTT Case Study. Electronics 2022, 11, 422. https://doi.org/10.3390/ electronics11030422es_ES
dc.identifier.issn2079-9292
dc.identifier.urihttp://hdl.handle.net/2183/30652
dc.description.abstract[Abstarct] The ever-increasing number of smart devices connected to the internet poses an unprecedented security challenge. This article presents the implementation of an Intrusion Detection System (IDS) based on the deployment of different one-class classifiers to prevent attacks over the Internet of Things (IoT) protocol Message Queuing Telemetry Transport (MQTT). The utilization of real data sets has allowed us to train the one-class algorithms, showing a remarkable performance in detecting attacks.es_ES
dc.language.isoenges_ES
dc.publisherMDPIes_ES
dc.relation.urihttps://doi.org/10.3390/electronics11030422es_ES
dc.rightsAtribución 4.0 Internacionales_ES
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/*
dc.subjectOne-classes_ES
dc.subjectK-meanses_ES
dc.subjectIoTes_ES
dc.subjectPCAes_ES
dc.subjectMQTTes_ES
dc.subjectAPEes_ES
dc.subjectSVMes_ES
dc.subjectNCBoPes_ES
dc.titleIntelligent one-class classifiers for the development of an intrusion detection system: the MQTT case studyes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.accessinfo:eu-repo/semantics/openAccesses_ES
UDC.journalTitleElectronicses_ES
UDC.volume11es_ES
UDC.issue3es_ES
dc.identifier.doihttps://doi.org/10.3390/electronics11030422


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