Listar por autor "Paez Fajardo, Galo"
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Synergistic Degradation Mechanism in Single Crystal Ni-Rich NMC//Graphite Cells
Paez Fajardo, Galo; Temprano, Israel; Piper, Louis (American Chemical Society, 2023-11-06)[Abstract]: Oxygen loss at high voltages in Ni-rich NMC//graphite Li-ion batteries promotes degradation, but increasing evidence from full cells reveals that the depth of discharge choice can further accelerate aging, i.e., ...