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http://hdl.handle.net/2183/8361

Caracterización de pizarras comerciales del NO de España a partir de DRX, microscopía electrónica (EMPA, SEM, TEM) y FRX

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CA 34 2009 art 8.pdf (2.62 MB)

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URI: http://hdl.handle.net/2183/8361

Publication date

2009

Authors

Gómez-Fernández, F.
Ward, C.R.
Bauluz, B.

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Bibliographic citation

Cadernos do Laboratorio Xeolóxico de Laxe, 2009, 34: 127-142. ISSN: 0213-4497

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Abstract

Description

Keywords

Rietveld method Truchas Syncline Electron microscopy Electron microprobe

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REV - CLXL - Vol. 34 (2009)