Measurement Effects on Ø-Symmetric Shaped Patterns Generated by Circular Continuous Apertures

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UDC.coleccionInvestigaciónes_ES
UDC.departamentoEnxeñaría de Computadoreses_ES
UDC.endPage70es_ES
UDC.grupoInvGrupo de Tecnoloxía Electrónica e Comunicacións (GTEC)es_ES
UDC.issue5es_ES
UDC.journalTitleIEEE Antennas and Propagation Magazinees_ES
UDC.startPage68es_ES
UDC.volume45es_ES
dc.contributor.authorBrégains, Julio
dc.contributor.authorAres Pena, F. J.
dc.contributor.authorMoreno Piquero, E.
dc.date.accessioned2016-09-06T15:00:07Z
dc.date.available2016-09-06T15:00:07Z
dc.date.issued2003-10
dc.description.abstract[Abstract] Sidelobe-level and ripple behaviors of Ø-symmetric shaped patterns, generated by circular, real and complex, continuous Taylor distributions, is analyzed as a function of measurement distances. This paper reveals that real distributions suffer less-significant power pattern degradation than complex distributions at near-field distances.es_ES
dc.identifier.citationJ.C. Bregains ; F. Ares ; E. Moreno "Measurement distance effects on Ø-symmetric shaped patterns generated by circular continuous apertures", IEEE Antennas and Propagation Magazine, 68 - 70 Volume: 45, Issue: 5, 2003es_ES
dc.identifier.doi10.1109/MAP.2003.1252812
dc.identifier.issn1045-9243
dc.identifier.urihttp://hdl.handle.net/2183/17255
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineerses_ES
dc.relation.urihttp://dx.doi.org/10.1109/MAP.2003.1252812es_ES
dc.rights.accessRightsopen accesses_ES
dc.subjectShape measurementes_ES
dc.subjectAperture antennases_ES
dc.subjectAntenna measurementses_ES
dc.subjectDegradationes_ES
dc.subjectEquationses_ES
dc.subjectPower generationes_ES
dc.subjectPattern analysises_ES
dc.subjectAntenna radiation patternses_ES
dc.subjectRead only memoryes_ES
dc.subjectAntennas and propagationes_ES
dc.titleMeasurement Effects on Ø-Symmetric Shaped Patterns Generated by Circular Continuous Apertureses_ES
dc.typejournal articlees_ES
dspace.entity.typePublication
relation.isAuthorOfPublicationdea37bb9-4430-472b-a48c-c5a8ca42b84b
relation.isAuthorOfPublication.latestForDiscoverydea37bb9-4430-472b-a48c-c5a8ca42b84b

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