Feature Selection With Limited Bit Depth Mutual Information for Embedded Systems

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http://hdl.handle.net/2183/21121Collections
- Investigación (FIC) [1634]
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Feature Selection With Limited Bit Depth Mutual Information for Embedded SystemsDate
2018-09-17Citation
Morán-Fernández, L.; Bolón-Canedo, V.; Alonso-Betanzos, A. Feature Selection with Limited Bit Depth Mutual Information for Embedded Systems. Proceedings 2018, 2, 1187.
Abstract
[Abstract] Data is growing at an unprecedented pace. With the variety, speed and volume of data flowing through networks and databases, newer approaches based on machine learning are required. But what is really big in Big Data? Should it depend on the numerical representation of the machine? Since portable embedded systems have been growing in importance, there is also increased interest in implementing machine learning algorithms with a limited number of bits. Not only learning, also feature selection, most of the times a mandatory preprocessing step in machine learning, is often constrained by the available computational resources. In this work, we consider mutual information—one of the most common measures of dependence used in feature selection algorithms—with reduced precision parameters.
Keywords
Feature selection
Mutual information
Reduced precision
Embedded systems
Big Data
Mutual information
Reduced precision
Embedded systems
Big Data
Description
Trátase dun resumo estendido da ponencia
Editor version
Rights
Atribución 4.0 Internacional
ISSN
2504-3900